IEC TS 62607-8-1-2020 納米制造--關(guān)鍵控制特性--第8-1部分:納米金屬氧化物界面器件--熱激發(fā)電流對缺陷狀態(tài)的試驗方法 Nanomanufacturing – Key control characteristics – Part 8-1: Nano-enabled metal-oxide interfacial devices – Test method for defect states by thermally stimulated curr

There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. This part of IEC 62607 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano- enabled metal-oxide interfacial devices.
This document includes:
– outlines of the experimental procedures used to measure TSC,
– methods of interpretation of results and discussion of data analysis, and
– case studies.dition 1.0 2020-04 TECHNICAL SPECIFICATION colour inside Nanomanufacturing – Key control characteristics – Part 8-1: Nano-enabled metal-oxide interfacial devices – Test method for defect states by thermally stimulated current IEC TS 62607-8-1:2020-04(en) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright ？ 2020 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of th