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NF C96-022-44-2016 Semiconductor devices - Mechanical and climatic test methods - Part 44 - neutron beam irradiated single event effect (SEE) test method for semiconductor devices NF C96-022-44-2016 Semiconductor devices - Mechanical and climatic test methods - Part 44 - neutron beam irradiated single event effect (SEE) test method for semiconductor devices

NF C96-022-44-2016 Semiconductor devices - Mechanical and climatic test methods - Part 44 - neutron beam irradiated single event effect (SEE) test method for semiconductor devices

  • 標準類(lèi)別：
  • 標準大?。?/li>
  • 標準編號：NF C96-022-44-2016
  • 標準狀態(tài)：現行
  • 更新時(shí)間：2023-11-22
  • 下載次數：次
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