首頁(yè) > 標準下載>IEC 60749-26-2018 半導體器件--機械和氣候試驗方法--第26部分:靜電放電(ESD)靈敏度試驗--人體模型(HBM) Semiconductor devices -- Mechanical and climatic test methods -- Part 26: Electrostatic discharge (ESD) sensitivity testing -- Human body model (HBM)免費下載
IEC 60749-26-2018 半導體器件--機械和氣候試驗方法--第26部分:靜電放電(ESD)靈敏度試驗--人體模型(HBM) Semiconductor devices -- Mechanical and climatic test methods -- Part 26: Electrostatic discharge (ESD) sensitivity testing -- Human body model (HBM) IEC 60749-26-2018 半導體器件--機械和氣候試驗方法--第26部分:靜電放電(ESD)靈敏度試驗--人體模型(HBM) Semiconductor devices -- Mechanical and climatic test methods -- Part 26: Electrostatic discharge (ESD) sensitivity testing -- Human body model (HBM)

IEC 60749-26-2018 半導體器件--機械和氣候試驗方法--第26部分:靜電放電(ESD)靈敏度試驗--人體模型(HBM) Semiconductor devices -- Mechanical and climatic test methods -- Part 26: Electrostatic discharge (ESD) sensitivity testing -- Human body model (HBM)

  • 標準類(lèi)別:
  • 標準大?。?/li>
  • 標準編號:IEC 60749-26-2018
  • 標準狀態(tài):現行
  • 更新時(shí)間:2023-08-26
  • 下載次數:次
標準簡(jiǎn)介

This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels.
ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected.dition 4.0 2018-01 INTERNATIONAL STANDARD NORME INTERNATIONALE colour inside Semiconductor devices – Mechanical and climatic test methods – Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM) Dispositifs à semiconducteurs – Méthodes d'essais mécaniques et climatiques – Partie 26: Essai de sensibilité aux décharges électrostatiques (DES) – Modèle du corps humain (HBM) IEC 60749-26:2018-01(en-fr) THIS

標準截圖
下一條:返回列表
版權:如無(wú)特殊注明,文章轉載自網(wǎng)絡(luò ),侵權請聯(lián)系cnmhg168#163.com刪除!文件均為網(wǎng)友上傳,僅供研究和學(xué)習使用,務(wù)必24小時(shí)內刪除。
欧美AAAAAA级午夜福利_国产福利写真片视频在线_91香蕉国产观看免费人人_莉莉精品国产免费手机影院