IEC 60747-5-11-2019 半導體器件--第5-11部分:光電子器件--發(fā)光二極管--發(fā)光二極管的輻射和非輻射電流的試驗方法 Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes

This part of IEC 60747 specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.dition 1.0 2019-12 INTERNATIONAL STANDARD colour inside Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes IEC 60747-5-11:2019-12(en) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright ？ 2019 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication